Shock Recovery Test of a MEMS-Microphone - 7 Angebote vergleichen

PreiseMärz 17März 19Sep. 19
Schnitt 28,90 28,86 27,49
Nachfrage
Bester Preis: 22,24 (vom 18.09.2019)
1
9783330513235 - Shock Recovery Test of a MEMS-Microphone

Shock Recovery Test of a MEMS-Microphone

Lieferung erfolgt aus/von: Vereinigtes Königreich Großbritannien und Nordirland DE NW

ISBN: 9783330513235 bzw. 3330513233, in Deutsch, neu.

Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Lieferzeit: 11 Tage.
Nowadays Micro Electromechanical Systems (MEMS) can be found in a large variety of different devices. Besides from automotive or in the field for medical devices, another major global market for MEMS is the application in consumer electronics. No matter if used in laptops, smartphones, or any kind of sport gadgets, millions of devices were sold here per year. This makes non-time consuming and cost efficient productive testing mandatory, to sort out defective devices after production. Since mechanical & electrical components are involved in a MEMS, dedicated tests have to be executed for both components. Dependent on the test coverage, this has to be done either in front or back end test right before shipment. At the customer site, the MEMS may face well defined conditions during qualification process of the final device. The drop or shock of a device could be such a condition and may lead to malfunctions of the implemented MEMS. Therefore, integrated safety and compensation functions against mechanical stress are specified by IC design, to bring the MEMS back to its normal operating point. It is the test engineer's task, to test the correct behavior of these integrated functions.
2
9783330513235 - Sabutsch, Harald: Shock Recovery Test of a MEMS-Microphone
Sabutsch, Harald

Shock Recovery Test of a MEMS-Microphone

Lieferung erfolgt aus/von: Deutschland DE HC NW

ISBN: 9783330513235 bzw. 3330513233, in Deutsch, Av Akademikerverlag, gebundenes Buch, neu.

Lieferung aus: Deutschland, Versandkostenfrei innerhalb von Deutschland.
Nowadays Micro Electromechanical Systems (MEMS) can be found in a large variety of different devices. Besides from automotive or in the field for medical devices, another major global market for MEMS is the application in consumer electronics. No matter if used in laptops, smartphones, or any kind of sport gadgets, millions of devices were sold here per year. This makes non-time consuming and cost efficient productive testing mandatory, to sort out defective devices after production. Since Nowadays Micro Electromechanical Systems (MEMS) can be found in a large variety of different devices. Besides from automotive or in the field for medical devices, another major global market for MEMS is the application in consumer electronics. No matter if used in laptops, smartphones, or any kind of sport gadgets, millions of devices were sold here per year. This makes non-time consuming and cost efficient productive testing mandatory, to sort out defective devices after production. Since mechanical & electrical components are involved in a MEMS, dedicated tests have to be executed for both components. Dependent on the test coverage, this has to be done either in front or back end test right before shipment. At the customer site, the MEMS may face well defined conditions during qualification process of the final device. The drop or shock of a device could be such a condition and may lead to malfunctions of the implemented MEMS. Therefore, integrated safety and compensation functions against mechanical stress are specified by IC design, to bring the MEMS back to its normal operating point. It is the test engineer´s task, to test the correct behavior of these integrated functions. Lieferzeit 1-2 Werktage.
3
9783330513235 - Harald Sabutsch: Shock Recovery Test of a MEMS-Microphone - For High Volume Productive Front End Test Environment
Harald Sabutsch

Shock Recovery Test of a MEMS-Microphone - For High Volume Productive Front End Test Environment

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330513235 bzw. 3330513233, in Deutsch, AV Akademikerverlag, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Shock Recovery Test of a MEMS-Microphone: Nowadays Micro Electromechanical Systems (MEMS) can be found in a large variety of different devices. Besides from automotive or in the field for medical devices, another major global market for MEMS is the application in consumer electronics. No matter if used in laptops, smartphones, or any kind of sport gadgets, millions of devices were sold here per year. This makes non-time consuming and cost efficient productive testing mandatory, to sort out defective devices after production. Since mechanical & electrical components are involved in a MEMS, dedicated tests have to be executed for both components. Dependent on the test coverage, this has to be done either in front or back end test right before shipment. At the customer site, the MEMS may face well defined conditions during qualification process of the final device. The drop or shock of a device could be such a condition and may lead to malfunctions of the implemented MEMS. Therefore, integrated safety and compensation functions against mechanical stress are specified by IC design, to bring the MEMS back to its normal operating point. It is the test engineer`s task, to test the correct behavior of these integrated functions. Englisch, Taschenbuch.
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3330513233 - Shock Recovery Test of a MEMS-Microphone

Shock Recovery Test of a MEMS-Microphone

Lieferung erfolgt aus/von: Deutschland DE NW

ISBN: 3330513233 bzw. 9783330513235, in Deutsch, neu.

Shock Recovery Test of a MEMS-Microphone ab 28.9 EURO For High Volume Productive Front End Test Environment.
5
3330513233 - Harald Sabutsch: Shock Recovery Test of a MEMS-Microphone
Harald Sabutsch

Shock Recovery Test of a MEMS-Microphone

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 3330513233 bzw. 9783330513235, in Deutsch, AV Akademikerverlag, Taschenbuch, neu.

28,90 + Versand: 7,50 = 36,40
unverbindlich
Shock Recovery Test of a MEMS-Microphone ab 28.9 € als Taschenbuch: For High Volume Productive Front End Test Environment. Aus dem Bereich: Bücher, Wissenschaft, Technik,.
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9783330513235 - Sabutsch, Harald: Shock Recovery Test of a MEMS-Microphone
Sabutsch, Harald

Shock Recovery Test of a MEMS-Microphone (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330513235 bzw. 3330513233, in Deutsch, Taschenbuch, neu.

Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
7
9783330513235 - Sabutsch: Shock Recovery Test of a MEMS-
Sabutsch

Shock Recovery Test of a MEMS- (2017)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783330513235 bzw. 3330513233, vermutlich in Englisch, Taschenbuch, neu.

Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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