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100%: Javier Salcedo; Jean-Jacques Hajjar; Juin J. Liou; Parthasarathy Srivatsan; Qiang Cui; Yuanzhong Zhou: On-chip Electro-static Discharge (esd) Protection For Radio-frequency Integrated Circuits (ISBN: 9783319358246) 2016, in Englisch, Taschenbuch.Nur diese Ausgabe anzeigen…
77%: Cui, Qiang (Author)/ Liou, Juin J. (Author)/ Hajjar, Jean-Jacques (Author)/ Salcedo, Javier (Author)/ Zhou, Yuanzhong (Author)/ Srivatsan, Parthasarathy (Author): On-chip Electro-static Discharge (esd) Protection for Radio-frequency Integrated Circuits (Hardcover) (ISBN: 9783319108186) in Deutsch, Broschiert.Nur diese Ausgabe anzeigen…
58%: Qiang Cui; Juin J. Liou; Jean-Jacques Hajjar; Javier Salcedo; Yuanzhong Zhou; Parthasarathy Srivatsan: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits als eBook von Hajj. (ISBN: 9783319108193) 2015, Springer International Publishing, in Deutsch, auch als eBook.Nur diese Ausgabe anzeigen…
On-chip Electro-static Discharge (esd) Protection For Radio-frequency Integrated Circuits
14 Angebote vergleichen
| Preise | 2016 | 2018 | 2019 |
|---|---|---|---|
| Schnitt | € 91,43 | € 89,99 | € 78,08 |
| Nachfrage |
1
Qiang Cui; Juin J. Liou; Jean-Jacques Hajjar; Javier Salcedo; Yuanzhong Zhou; Parthasarathy Srivatsan
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
~EN PB NWISBN: 9783319358246 bzw. 3319358243, vermutlich in Englisch, Springer Shop, Taschenbuch, neu.
Lieferung aus: Schweiz, Lagernd, zzgl. Versandkosten.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Soft cover.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance. Soft cover.
2
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits Qiang Cui Author
~EN PB NWISBN: 9783319358246 bzw. 3319358243, vermutlich in Englisch, Springer International Publishing, Taschenbuch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices.The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies.Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices.The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies.Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
3
On-chip Electro-static Discharge (esd) Protection For Radio-frequency Integrated Circuits
~EN NWISBN: 9783319358246 bzw. 3319358243, vermutlich in Englisch, neu.
Lieferung aus: Kanada, Lagernd, zzgl. Versandkosten.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs'' ESD safety level, while maximizing RF performance.
This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs'' ESD safety level, while maximizing RF performance.
4
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On-Chip Electro-Static Discharge (Esd) Protection for Radio-Frequency Integrated Circuits (2016)
DE NW RPISBN: 9783319358246 bzw. 3319358243, in Deutsch, Springer International Publishing AG, neu, Nachdruck.
Von Händler/Antiquariat, Books2Anywhere [190245], Fairford, GLOS, United Kingdom.
New Book. Delivered from our US warehouse in 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND.Established seller since 2000.
New Book. Delivered from our US warehouse in 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND.Established seller since 2000.
5
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On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (2016)
DE PB NWISBN: 9783319358246 bzw. 3319358243, in Deutsch, Springer, Taschenbuch, neu.
Von Händler/Antiquariat, Herb Tandree Philosophy Books [17426], Stroud, GLOS, United Kingdom.
9783319358246 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher.
9783319358246 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher.
6
Symbolbild
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (2016)
DE PB NW RPISBN: 9783319358246 bzw. 3319358243, in Deutsch, Springer, Taschenbuch, neu, Nachdruck.
Von Händler/Antiquariat, Ria Christie Collections [59718070], Uxbridge, United Kingdom.
PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK.
PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK.
7
Gebr. On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (2018)
DE USISBN: 9783319108186 bzw. 3319108182, in Deutsch, gebraucht.
Lieferung aus: Deutschland, 01-3 Tage.
Letzte Aktualisierung am: 19.02.2018 10:43:59, Binding: Gebundene Ausgabe, Edition: 2015, Label: Springer, Publisher: Springer, medium: Gebundene Ausgabe, numberOfPages: 86, publicationDate: 2015-03-26, authors: Qiang Cui, Liou, Juin J., Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan, languages: english, ISBN: 3319108182.
Letzte Aktualisierung am: 19.02.2018 10:43:59, Binding: Gebundene Ausgabe, Edition: 2015, Label: Springer, Publisher: Springer, medium: Gebundene Ausgabe, numberOfPages: 86, publicationDate: 2015-03-26, authors: Qiang Cui, Liou, Juin J., Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan, languages: english, ISBN: 3319108182.
8
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Cui, Qiang (Author)/ Liou, Juin J. (Author)/ Hajjar, Jean-Jacques (Author)/ Salcedo, Javier (Author)/ Zhou, Yuanzhong (Author)/ Srivatsan, Parthasarathy (Author)
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (2015)
DE HC NWISBN: 9783319108186 bzw. 3319108182, in Deutsch, Springer, gebundenes Buch, neu.
Von Händler/Antiquariat, Revaluation Books [2134736], Exeter, United Kingdom.
9.30x6.20 inches. In Stock.
9.30x6.20 inches. In Stock.
9
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On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (Hardback) (2015)
DE HC NWISBN: 9783319108186 bzw. 3319108182, in Deutsch, Springer International Publishing AG, Switzerland, gebundenes Buch, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Versandkostenfrei.
Von Händler/Antiquariat, The Book Depository EURO [60485773], London, United Kingdom.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, The Book Depository EURO [60485773], London, United Kingdom.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
10
Cui, Qiang; Liou, Juin J.; Hajjar, Jean-Jacques; Salcedo, Javier; Zhou, Yuanzhong; Srivatsan, Parthasarathy
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
DE NW EBISBN: 9783319108186 bzw. 3319108182, in Deutsch, Springer International Publishing, neu, E-Book.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum download.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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