X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
8 Angebote vergleichen
| Preise | 2013 | 2014 | 2015 | 2016 | 2023 |
|---|---|---|---|---|---|
| Schnitt | € 153,75 | € 168,38 | € 169,80 | € 113,35 | € 166,64 |
| Nachfrage |
1
Symbolbild
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (2004)
DE NW RPISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Jan 2004, neu, Nachdruck.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
This item is printed on demand - Print on Demand Titel. Neuware - This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 204 pp. Englisch.
This item is printed on demand - Print on Demand Titel. Neuware - This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 204 pp. Englisch.
2
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
~EN HC NWISBN: 9783540201793 bzw. 3540201793, vermutlich in Englisch, Springer Nature, gebundenes Buch, neu.
Lieferung aus: Deutschland, Lagernd, zzgl. Versandkosten.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Hard cover.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Hard cover.
3
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE USISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Verlag, Springer, Springer, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, zzgl. Versandkosten, in-stock.
This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
4
Symbolbild
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DEISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures Schmidbauer, Martin, This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures Schmidbauer, Martin, This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
5
Symbolbild
X-Ray Diffuse Scattering From Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts in Modern Physics) (2004)
DE HC USISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer, gebundenes Buch, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, zzgl. Versandkosten, Verandgebiet: DOM.
Von Händler/Antiquariat, ExtremelyReliable, TX, Richmond, [RE:4].
Hardcover.
Von Händler/Antiquariat, ExtremelyReliable, TX, Richmond, [RE:4].
Hardcover.
6
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (2004)
~EN NWISBN: 3540201793 bzw. 9783540201793, vermutlich in Englisch, Springer Berlin Heidelberg; Springer-Verlag GmbH, neu.
Von Händler/Antiquariat, MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
7
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE NWISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Science+Business Media, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
8
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
~EN HC NWISBN: 9783540201793 bzw. 3540201793, vermutlich in Englisch, Springer, Berlin/Heidelberg, Deutschland, gebundenes Buch, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, 4-9 business days.
Lade…