Leakage currents in MOS transistor als von - 5 Angebote vergleichen

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9783659891656 - P. K. Bikki: Leakage currents in MOS transistor
Symbolbild
P. K. Bikki

Leakage currents in MOS transistor (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783659891656 bzw. 3659891657, in Deutsch, LAP Lambert Academic Publishing Jun 2017, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
Neuware - In order to bring the classification of leakage minimization approaches, analyzed based on their fundamental design and mechanism, such as biasing technique, power gating, and multi-threshold techniques. A brief summary of different leakage control schemes with their merits and demerits along with the limitations by using these schemes are presented. In this survey, origins of leakage currents in a short-channel device and various leakage control techniques for ultra-low power SRAM design are discussed. The rest of the book chapter is organized as follows. In section 2 presents the origin of leakage current in a short-channel device. Various biasing techniques for leakage control SRAM are discussed in section 3. Emerging power gating techniques for low power SRAM designs are presented in section 4. Asymmetrical SRAM designs with multi-threshold transistor are described and comparisons of various low power techniques are tabulated in section 5. Finally, the survey chapter concludes in section 6. 52 pp. Englisch.
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9783659891656 - Bikki, P. K. / Karuppanan, P.: Leakage currents in MOS transistor
Symbolbild
Bikki, P. K. / Karuppanan, P.

Leakage currents in MOS transistor

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783659891656 bzw. 3659891657, in Deutsch, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, European-Media-Service Mannheim [1048135], Mannheim, Germany.
Publisher/Verlag: LAP Lambert Academic Publishing | In order to bring the classification of leakage minimization approaches, analyzed based on their fundamental design and mechanism, such as biasing technique, power gating, and multi-threshold techniques. A brief summary of different leakage control schemes with their merits and demerits along with the limitations by using these schemes are presented. In this survey, origins of leakage currents in a short-channel device and various leakage control techniques for ultra-low power SRAM design are discussed. The rest of the book chapter is organized as follows. In section 2 presents the origin of leakage current in a short-channel device. Various biasing techniques for leakage control SRAM are discussed in section 3. Emerging power gating techniques for low power SRAM designs are presented in section 4. Asymmetrical SRAM designs with multi-threshold transistor are described and comparisons of various low power techniques are tabulated in section 5. Finally, the survey chapter concludes in section 6. | Format: Paperback | Language/Sprache: english | 52 pp.
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9783659891656 - Bikki, P. K. / Karuppanan, P.: Leakage currents in MOS transistor
Bikki, P. K. / Karuppanan, P.

Leakage currents in MOS transistor (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783659891656 bzw. 3659891657, in Deutsch, 52 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Syndikat Buchdienst, [4235284].
In order to bring the classification of leakage minimization approaches, analyzed based on their fundamental design and mechanism, such as biasing technique, power gating, and multi-threshold techniques. A brief summary of different leakage control schemes with their merits and demerits along with the limitations by using these schemes are presented. In this survey, origins of leakage currents in a short-channel device and various leakage control techniques for ultra-low power SRAM design are discussed. The rest of the book chapter is organized as follows. In section 2 presents the origin of leakage current in a short-channel device. Various biasing techniques for leakage control SRAM are discussed in section 3. Emerging power gating techniques for low power SRAM designs are presented in section 4. Asymmetrical SRAM designs with multi-threshold transistor are described and comparisons of various low power techniques are tabulated in section 5. Finally, the survey chapter concludes in section 6. 2017, Taschenbuch / Paperback, Neuware, H: 220mm, B: 150mm, 52, Internationaler Versand, Selbstabholung und Barzahlung, PayPal, offene Rechnung, Banküberweisung.
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9783659891656 - P. K. Bikki: Leakage currents in MOS transistor
P. K. Bikki

Leakage currents in MOS transistor (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783659891656 bzw. 3659891657, in Deutsch, 52 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Buchhandlung Hoffmann, [3174608].
Neuware - In order to bring the classification of leakage minimization approaches, analyzed based on their fundamental design and mechanism, such as biasing technique, power gating, and multi-threshold techniques. A brief summary of different leakage control schemes with their merits and demerits along with the limitations by using these schemes are presented. In this survey, origins of leakage currents in a short-channel device and various leakage control techniques for ultra-low power SRAM design are discussed. The rest of the book chapter is organized as follows. In section 2 presents the origin of leakage current in a short-channel device. Various biasing techniques for leakage control SRAM are discussed in section 3. Emerging power gating techniques for low power SRAM designs are presented in section 4. Asymmetrical SRAM designs with multi-threshold transistor are described and comparisons of various low power techniques are tabulated in section 5. Finally, the survey chapter concludes in section 6. 06.06.2017, Taschenbuch, Neuware, 220x150x3 mm, 94g, 52, Internationaler Versand, offene Rechnung (Vorkasse vorbehalten), sofortueberweisung.de, Selbstabholung und Barzahlung, Skrill/Moneybookers, PayPal, Lastschrift, Banküberweisung.
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9783659891656 - P. K. Bikki, P. Karuppanan: Leakage currents in MOS transistor
P. K. Bikki, P. Karuppanan

Leakage currents in MOS transistor (2017)

Lieferung erfolgt aus/von: Deutschland EN PB NW

ISBN: 9783659891656 bzw. 3659891657, in Englisch, 52 Seiten, LAP LAMBERT Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei.
Von Händler/Antiquariat, dodax-shop-eu.
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