Advanced Characterization Techniques for Thin Film Solar Cells
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Bester Preis: 113,09 (vom 30.07.2013)
1
Editor: Uwe Rau, Editor: Daniel Abou-Ras, Editor: Thomas Kirchartz

Advanced Characterization Techniques for Thin Film Solar Cells (2011)

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika EN NW FE

ISBN: 9783527636280 bzw. 3527636285, in Englisch, 583 Seiten, Wiley-VCH, neu, Erstausgabe.

113,09 ($ 150,00)¹ + Versand: 3,01 ($ 3,99)¹ = 116,10 ($ 153,99)¹
unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 6 to 10 days.
Von Händler/Antiquariat, Amazon.com.
Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D. For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses. , Printed Access Code, Ausgabe: 1, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: Book, Publiziert: 2011-04-07, Studio: Wiley-VCH.
2
9783527636310 - Herausgeber: Uwe Rau, Herausgeber: Daniel Abou-Ras, Herausgeber: Thomas Kirchartz: Advanced Characterization Techniques for Thin Film Solar Cells (English Edition)
Herausgeber: Uwe Rau, Herausgeber: Daniel Abou-Ras, Herausgeber: Thomas Kirchartz

Advanced Characterization Techniques for Thin Film Solar Cells (English Edition) (2011)

Lieferung erfolgt aus/von: Deutschland EN NW FE EB DL

ISBN: 9783527636310 bzw. 3527636315, in Englisch, 585 Seiten, Wiley-VCH, neu, Erstausgabe, E-Book, elektronischer Download.

Lieferung aus: Deutschland, E-Book zum Download, Versandkostenfrei.
Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D. For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses. , Kindle Ausgabe, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH.
3
9783527636310 - Herausgeber: Uwe Rau, Herausgeber: Daniel Abou-Ras, Herausgeber: Thomas Kirchartz: Advanced Characterization Techniques for Thin Film Solar Cells
Herausgeber: Uwe Rau, Herausgeber: Daniel Abou-Ras, Herausgeber: Thomas Kirchartz

Advanced Characterization Techniques for Thin Film Solar Cells (2011)

Lieferung erfolgt aus/von: Deutschland EN NW FE EB DL

ISBN: 9783527636310 bzw. 3527636315, in Englisch, 585 Seiten, Wiley-VCH, neu, Erstausgabe, E-Book, elektronischer Download.

Lieferung aus: Deutschland, E-Book zum Download.
Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D. For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses. , Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH.
4
9783527636310 - Editor: Uwe Rau, Editor: Daniel Abou-Ras, Editor: Thomas Kirchartz: Advanced Characterization Techniques for Thin Film Solar Cells
Editor: Uwe Rau, Editor: Daniel Abou-Ras, Editor: Thomas Kirchartz

Advanced Characterization Techniques for Thin Film Solar Cells (2011)

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika EN NW FE EB DL

ISBN: 9783527636310 bzw. 3527636315, in Englisch, 585 Seiten, Wiley-VCH, neu, Erstausgabe, E-Book, elektronischer Download.

Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum Download.
Written by scientists from leading institutes in Germany, USA and Spain who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods. They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D. For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses. , Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH.
5
9783527339921 - Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells (2016)

Lieferung erfolgt aus/von: Niederlande EN HC NW

ISBN: 9783527339921 bzw. 3527339922, in Englisch, Wiley-VCH, Weinheim, Deutschland, gebundenes Buch, neu.

227,99
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3527339922 - Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes

Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 3527339922 bzw. 9783527339921, Band: 2, vermutlich in Englisch, Wiley-VCH, Weinheim, Deutschland, neu.

Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes ab 278.99 EURO 2. Auflage.
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9783527339921 - Advanced Characterization Techniques for Thin Film Solar Cells Daniel Abou-Ras Editor

Advanced Characterization Techniques for Thin Film Solar Cells Daniel Abou-Ras Editor

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika ~EN HC NW

ISBN: 9783527339921 bzw. 3527339922, vermutlich in Englisch, Wiley, gebundenes Buch, neu.

211,18 ($ 233,02)¹
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Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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9783527339921 - Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau: Advanced Characterization Techniques for Thin Film Solar Cells
Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau

Advanced Characterization Techniques for Thin Film Solar Cells (2016)

Lieferung erfolgt aus/von: Frankreich EN NW

ISBN: 9783527339921 bzw. 3527339922, in Englisch, 800 Seiten, 2. Ausgabe, Wiley-VCH Verlag GmbH, neu.

256,28 + Versand: 5,82 = 262,10
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9783527339921 - Daniel Abou-Ras: Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes
Daniel Abou-Ras

Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes

Lieferung erfolgt aus/von: Deutschland ~EN HC NW

ISBN: 9783527339921 bzw. 3527339922, Band: 2, vermutlich in Englisch, Wiley VCH Verlag Gmbh, gebundenes Buch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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9783527339921 - Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes

Advanced Characterization Techniques for Thin Film Solar Cells. 2 volumes (2016)

Lieferung erfolgt aus/von: Österreich ~EN NW

ISBN: 9783527339921 bzw. 3527339922, Band: 2, vermutlich in Englisch, Wiley-VCH, neu.

262,99 + Versand: 3,50 = 266,49
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