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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
10 Angebote vergleichen
Preise | 2018 | 2023 |
---|---|---|
Schnitt | € 154,53 | € 117,69 |
Nachfrage |
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (2004)
ISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Jan 2004, neu, Nachdruck.
This item is printed on demand - Print on Demand Titel. Neuware - This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 204 pp. Englisch.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540201793 bzw. 3540201793, vermutlich in Englisch, Springer Nature, gebundenes Buch, neu.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Hard cover.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540399865 bzw. 3540399860, vermutlich in Englisch, Springer Nature, neu, E-Book, elektronischer Download.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. eBook.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Verlag, Springer, Springer, gebraucht.
This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures Schmidbauer, Martin, This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
X-Ray Diffuse Scattering From Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts in Modern Physics) (2004)
ISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer, gebundenes Buch, gebraucht.
Von Händler/Antiquariat, ExtremelyReliable, TX, Richmond, [RE:4].
Hardcover.
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (2004)
ISBN: 3540201793 bzw. 9783540201793, vermutlich in Englisch, Springer Berlin Heidelberg; Springer-Verlag GmbH, neu.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540399865 bzw. 3540399860, in Deutsch, Springer Nature, neu, E-Book.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540201793 bzw. 3540201793, in Deutsch, Springer Science+Business Media, neu.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
ISBN: 9783540201793 bzw. 3540201793, vermutlich in Englisch, Springer, Berlin/Heidelberg, Deutschland, gebundenes Buch, neu.