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100%: Schmidbauer, Martin: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts in Modern Physics) (ISBN: 9783642057694) 2010, in Englisch.Nur diese Ausgabe anzeigen…
89%: Martin Schmidbauer: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (ISBN: 9783540399865) Springer Nature, in Englisch, auch als eBook.Nur diese Ausgabe anzeigen…
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (Springer Tracts in Modern Physics)
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| Preise | 2014 | 2015 | 2016 | 2017 | 2023 |
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| Schnitt | € 166,71 | € 191,17 | € 203,24 | € 213,99 | € 166,56 |
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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures (Paperback) (2010)
DE PB NW RPISBN: 9783642057694 bzw. 3642057691, in Deutsch, Springer-Verlag Berlin and Heidelberg GmbH Co. KG, Germany, Taschenbuch, neu, Nachdruck.
Von Händler/Antiquariat, The Book Depository EURO [60485773], London, United Kingdom.
Language: English Brand New Book ***** Print on Demand *****.This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Softcover reprint of hardcover 1st ed. 2004.
Language: English Brand New Book ***** Print on Demand *****.This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Softcover reprint of hardcover 1st ed. 2004.
2
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
~EN PB NWISBN: 9783642057694 bzw. 3642057691, vermutlich in Englisch, Springer Nature, Taschenbuch, neu.
Lieferung aus: Deutschland, Lagernd, zzgl. Versandkosten.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Soft cover.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. Soft cover.
3
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
~EN NW EB DLISBN: 9783540399865 bzw. 3540399860, vermutlich in Englisch, Springer Nature, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, Lagernd, zzgl. Versandkosten.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. eBook.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. eBook.
4
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures als von
DE HC NWISBN: 9783642057694 bzw. 3642057691, in Deutsch, Springer, gebundenes Buch, neu.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
5
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE HC NWISBN: 9783642057694 bzw. 3642057691, in Deutsch, Springer, Berlin/Heidelberg/New York, NY, Deutschland, gebundenes Buch, neu.
Softcover reprint of hardcover 1st ed. 2004. Softcover reprint of hardcover 1st ed. 2004.
6
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE PB NWISBN: 9783642057694 bzw. 3642057691, in Deutsch, Springer, Berlin/Heidelberg/New York, NY, Deutschland, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkosten, 3642057691.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
7
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE NW EBISBN: 9783540399865 bzw. 3540399860, in Deutsch, Springer Nature, neu, E-Book.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Lagernd.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
8
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
DE PB NWISBN: 9783642057694 bzw. 3642057691, in Deutsch, Springer Berlin Heidelberg, Taschenbuch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
9
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
~EN PB NWISBN: 9783642057694 bzw. 3642057691, vermutlich in Englisch, Springer, Berlin/Heidelberg/New York, NY, Deutschland, Taschenbuch, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, 4-9 business days.
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